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crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 1 of 24 ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram features ? 8mb: 256k x 36 or 512k x 18 organizations 4mb: 128k x 36 or 256k x 18 organizations 0.25 cmos technology synchronous register-latch mode of operation with self-timed late write single differential pecl clock +3.3v power supply, ground, 2.5v v ddq 2.5v lvttl input and output levels registered addresses, write enables, synchro- nous select, and data ins latched outputs common i/o 30 ? drivers asynchronous output enable and power down inputs boundary scan using limited set of jtag 1149.1 functions byte write capability & global write enable 7 x 17 bump ball grid array package with sram jedec standard pinout and boundary scan order description ibm0436a4anlab, ibm0436a8anlab, ibm0418a4anlab, and ibm0418a8anlab are 4mb and 8mb synchronous register-latch mode, high-performance cmos static random access memories (srams). these srams are versatile, have a wide input/output (i/o) interface, and can achieve cycle times as short as 4.5ns. differential k clocks are used to initiate the read/write operation; all internal operations are self-timed. at the rising edge of the k clock, all address, write-enables, sync select, and data input signals are registered inter- nally. data outputs are updated from output regis- ters off the falling edge of the k clock. an internal write buffer allows write data to follow one cycle after addresses and controls. the device is oper- ated with a single +3.3v power supply and is com- patible with 2.5v lvttl i/o interfaces. .
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 2 of 24 crll3325.03 08/06/2001 x36 bga pinout (top view) 1234567 a v ddq sa sa nc sa sa v ddq b nc nc sa nc sa nc,sa(8mb) nc c nc sa sa v dd sa sa nc d dq19 dq18 v ss nc v ss dq9 dq10 e dq22 dq20 v ss ss v ss dq11 dqb13 f v ddq dq21 v ss g v ss dq12 v ddq g dq24 dq23 sbwc nc sbwb dq14 dqb15 h dq25 dq26 v ss nc v ss dq17 dqb16 j v ddq v dd nc v dd nc v dd v ddq k dq34 dq35 v ss k v ss dq8 dq7 l dq33 dq32 sbwd k sbwa dq5 dq6 m v ddq dq30 v ss sw v ss dq3 v ddq n dq31 dq29 v ss sa v ss dq2 dq4 p dq28 dq27 v ss sa v ss dq0 dq1 r nc sa m1* v dd m2* sa nc t nc nc sa sa sa nc zz u v ddq tms tdi tck tdo nc v ddq * m1 and m2 are clock mode pins. for this application, m1 and m2 need to connect to v dd and v ss respectively. x18 bga pinout (top view) 1234567 a v ddq sa sa nc sa sa v ddq b nc nc sa nc sa nc,sa(8mb) nc c nc sa sa v dd sa sa nc d dq14 nc v ss nc v ss dq0 nc e nc dq15 v ss ss v ss nc dq1 f v ddq nc v ss g v ss dq2 v ddq g nc dq16 sbwb nc nc nc dq3 h dq17 nc v ss nc v ss dq4 nc j v ddq v dd nc v dd nc v dd v ddq k nc dq13 v ss k v ss nc dq8 l dq12 nc nc k sbwa dq7 nc m v ddq dq10 v ss sw v ss nc v ddq n dq11 nc v ss sa v ss dq6 nc p nc dq9 v ss sa v ss nc dq5 r nc sa m1 v dd m2 sa nc t nc sa sa nc sa sa zz u v ddq tms tdi tck tdo nc v ddq * m1 and m2 are clock mode pins. for this application, m1 and m2 need to connect to v dd and v ss respectively.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 3 of 24 pin description sa0-sa18 address input sa0-sa18 for 512k x 18 sa0-sa17 for 256k x 36 sa0-sa17 for 256k x 18 sa0-sa16 for 128k x 36 tdo ieee 1149.1 test output (lvttl level) dq0-dq35 data i/o dq0-dq17 for 512k x 18 dq0-dq35 for 256k x 36 g asynchronous output enable k, k differential input register clocks ss synchronous select sw write enable, global m1, m2 clock mode inputs. selects single or dual clock operation. sbwa write enable, byte a (dq0-dq8) v dd power supply (+3.3v) sbwb write enable, byte b (dq9-dq17) v ss ground sbwc write enable, byte c (dq18-dq26) v ddq output power supply sbwd write enable, byte d (dq27-dq35) zz synchronous sleep mode tms, tdi, tck ieee ? 1149.1 test inputs (lvttl levels) nc no connect ordering information part number organization speed leads ibm0436a8anlab - 4h 256k x 36 4.5ns access / 4.5ns cycle 7 x 17 bga ibm0436a8anlab - 5 256k x 36 5.0ns access / 5.0ns cycle 7 x 17 bga ibm0436a8anlab - 5h 256k x 36 5.5ns access / 5.5ns cycle 7 x 17 bga ibm0436a4anlab - 4h 128k x 36 4.5ns access / 4.5ns cycle 7 x 17 bga ibm0436a4anlab - 5 128k x 36 5.0ns access / 5.0ns cycle 7 x 17 bga ibm0436a4anlab - 5h 128k x 36 5.5ns access / 5.5ns cycle 7 x 17 bga ibm0418a4anlab - 4h 256k x 18 4.5ns access / 4.5ns cycle 7 x 17 bga ibm0418a4anlab - 5 256k x 18 5.0ns access / 5.0ns cycle 7 x 17 bga ibm0418a4anlab - 5h 256k x 18 5.5ns access / 5.5ns cycle 7 x 17 bga ibm0418a8anlab -4h 512k x 18 4.5ns access / 4.5ns cycle 7 x 17 bga ibm0418a8anlab -5 512k x 18 5.0ns access / 5.0ns cycle 7 x 17 bga ibm0418a8anlab -5h 512k x 18 5.5ns access / 5.5ns cycle 7 x 17 bga
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 4 of 24 crll3325.03 08/06/2001 block diagram sbw row decode col decode read/wr amp doc_array0 sa0-sa18 k zz g sw ss dq0-dq35 reg reg sbw 2:1 mux doc_mux0 write1 add reg write0 add reg read add reg read write match match1 latch latch0 wr_buf1 wr_buf0 2:1 mux doc_mux1 2:1 mux doc_mux2 sbw0 sw0 sw1 reg reg doc_ dout0
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 5 of 24 sram features late write the late write function allows for write data to be registered one cycle after addresses and controls. this fea- ture eliminates one bus-turnaround cycle, necessary when going from a read to a write operation. late write is accomplished by buffering write addresses and data so that the write operation occurs during the next write cycle. when a read cycle occurs after a write cycle, the address and write data information are stored tempo- rarily in holding registers. during the first write cycle preceded by a read cycle, the sram array is updated with address and data from the holding registers. read cycle addresses are monitored to determine if read data is to be supplied from the sram array or the write buffer. the bypassing of the sram array occurs on a byte-by-byte basis. when only one byte is written during a write cycle, read data from the last written address has new byte data from the write buffer and remaining bytes from the sram array. mode control mode control pins m1 and m2 are used to select four different jedec-standard read protocols. this sram supports single clock, register latch operation (m1 = v dd , m2 = v ss ). this datasheet describes single clock register latch functionality only. mode control inputs must be set at power up and must not change during sram operation. this sram is tested only in the register-latch mode. sleep mode the sleep mode is enabled by switching the synchronous signal zz high. when the sram is in the sleep mode, the outputs go to a high-z state and the sram draws standby current. sram data is preserved and a recovery time (t zzr ) is required before the sram resumes normal operation. power-up requirements to ensure the optimum internally regulated supply voltage, the sram requires 4 s of power-up time after v dd reaches its operating range. power-up and power-down sequencing the power supplies must be powered up in the following order: v dd , v ddq , and inputs. the power-down sequence must be in the reverse order. v ddq may not exceed v dd by more than 0.6v. no special tracking between power supplies is required.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 6 of 24 crll3325.03 08/06/2001 clock truth table kzzss sw sbwa sbwb sbwc sbwd dq (n) dq (n+1) mode l h llhx x xx x d out 0-35 read cycle all bytes l h ll l l hhh x d in 0-8 write cycle 1st byte l h lllhlhhx d in 9-17 write cycle 2nd byte l h ll l hh lh x d in 18-26 write cycle 3rd byte l h ll l hhhl x d in 27-35 write cycle 4th byte l h lllllllx d in 0-35 write cycle all bytes l h l l l h h h h x high-z abort write cycle l h l h x x x x x x high-z deselect cycle x h x x x x x x high-z high-z sleep mode output enable truth table operation g dq read l d out 0-35 read h high-z sleep (zz = h) x high-z write (sw = l) x high-z deselect (ss = h) x high-z absolute maximum ratings item symbol rating units notes power supply voltage v dd -0.5 to 4.3 v 1 output power supply voltage v ddq -0.5 to 2.825 v 1 input voltage v in -0.5 to 4.3 v 1, 2 dq input voltage v dqin -0.5 to 2.825 v 1 operating temperature t a 0 to 85 c 1 junction temperature t j 110 c 1 storage temperature t stg -55 to +125 c 1 short circuit output current i out 25 ma 1 1. stresses greater than those listed under ? absolute maximum ratings ? may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operati onal sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect r eli- ability. 2. excludes dq inputs.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 7 of 24 recommended dc operating conditions (t a = 0 to +85 c) parameter symbol min. typ. max. units notes supply voltage v dd 3.3 - 5% 3.3 3.3 + 10% v 1 output driver supply voltage v ddq 2.375 2.5 2.625 v 1 input high voltage v ih 1.65 ? v dd +0.3 v1, 2, 4 input low voltage v il -0.3 ? 0.8 v 1, 3, 4 pecl k-clock input high voltage v ih - pecl 2.135 ? 2.420 v 1, 2 pecl k-clock input low voltage v il - pecl 1.490 ? 1.825 v 1 output current i out ? 58ma 1. all voltages are referenced to v ss . all v dd , v ddq and v ss pins must be connected. 2. v ih (max)dc = v ddq + 0.3 v, v ih (max)ac = v ddq + 1.5 v (pulse width 4.0ns). 3. v il (min)dc = - 0.3 v, v il (min)ac= -1.5 v (pulse width 4.0ns). 4. it does not include dqs. dc electrical characteristics (t a = 0 to +85 c, v dd = 3.3v -5%, +10%) (part 1 of 2) parameter symbol min. max. units notes average power supply operating current- x36 (i out = 0, v in = v ih or v il, zz & ss = v il ) i dd4h i dd5 i dd5h ? 380 340 300 ma 1, 3 average power supply operating current - x18 (i out = 0, v in = v ih or v il, zz & ss = v il ) i dd4h i dd5 i dd5h ? 350 310 270 ma 1, 3 power supply standby current (ss = v ih , zz = v ih . all other inputs = v ih or v ih , i ih = 0) i sbss ? 150 ma 1 power supply sleep current (zz = v ih, all other inputs = v ih or v il , i out = 0) i sbzz ? 100 ma 1, 5 input leakage current, any input (except jtag) (v in = v ss or v ddq ) i li -2 +2 a output leakage current (v out = v ss or v ddq , dq in high-z) i lo -5 +5 a output ? high ? level voltage (i oh = -8ma) v oh 1.6 v ddq v2, 4 output ? low ? level voltage (i ol = +8ma) v ol v ss v ss + .4 v2, 4 1. i out = device output current. 2. minimum impedance output driver. 3. the numeric suffix indicates part operating at speed as indicated in ac characteristics on page 10: that is, i dd4h indicates 4.5ns cycle time. 4. jedec standard jesd8-6 class 1 compatible. 5. when zz = high, spec is guaranteed at 75 c junction temperature. 6. for jtag inputs only.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 8 of 24 crll3325.03 08/06/2001 jtag leakage current (v in = v ss or v dd ) i lijtag -50 +10 a 6 pbga thermal characteristics item symbol rating units thermal resistance junction to case r jc 1 c/w capacitance (t a = 0 to +85 c, v dd = 3.3v -5%, +10%, f = 1mhz) parameter symbol test condition max units input capacitance c in v in = 0v 4pf data i/o capacitance (dq0-dq35) c out v out = 0v 4pf ac test conditions (t a =0 to +70 c, v dd =3.3v -5%, +10%, v ddq =2.5v -5%, +5%) parameter symbol conditions units notes output driver supply voltage v ddq 2.5 input high level for 2.5v i/o v ih(2.5v) 2.25 v 2 input low level for 2.5v i/o v il(2.5v) 0.25 v 2 pecl k-clock input high voltage v ih-pecl 2.4 v peclk-clock input low voltage v il-pecl 1.5 v input rise time t r 1.0 ns input fall time t f 1.0 ns pecl clock input rise time t r-pecl 0.5 ns pecl clock input fall time t f-pecl 0.5 ns input and output timing reference level (except k,k )1.25v pecl clock reference level k and k cross point v output load conditions 1 1. see the ac test loading figure below. 2. does not include dqs. dc electrical characteristics (t a = 0 to +85 c, v dd = 3.3v -5%, +10%) (part 2 of 2) parameter symbol min. max. units notes 1. i out = device output current. 2. minimum impedance output driver. 3. the numeric suffix indicates part operating at speed as indicated in ac characteristics on page 10: that is, i dd4h indicates 4.5ns cycle time. 4. jedec standard jesd8-6 class 1 compatible. 5. when zz = high, spec is guaranteed at 75 c junction temperature. 6. for jtag inputs only.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 9 of 24 ac test loading dq 50 ? 50 ? 5pf 50 ? 25 ? 50 ? 5pf 1.25v 1.25v 1.25v test sensor
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 10 of 24 crll3325.03 08/06/2001 ac characteristics (t a = 0 to +85 c, v dd = 3.3v -5%, +10%, v ddq = 2.5v). parameter symbol -4h -5 -5h units notes min. max. min. max. min. max. cycle time t khkh 4.5 ? 5.0 ? 5.5 ? ns clock high pulse width t khkl 1.5 ? 1.5 ? 1.5 ? ns clock low pulse width t klkh 1.5 ? 1.5 ? 1.5 ? ns clock high to output valid t khqv ? 4.5 ? 5.0 ? 5.5 ns 1 clock low to output valid t klqv ? 2.0 ? 2.25 ? 2.5 ns 1 address setup time t avkh 0.5 ? 0.5 ? 0.5 ? ns address hold time t khax 1.0 ? 1.0 ? 1.0 ? ns sync select setup time t svkh 0.5 ? 0.5 ? 0.5 ? ns sync select hold time t khsx 1.0 ? 1.0 ? 1.0 ? ns write enables setup time t wvkh 0.5 ? 0.5 ? 0.5 ? ns write enables hold time t khwx 1.0 ? 1.0 ? 1.0 ? ns data in setup time t dvkh 0.5 ? 0.5 ? 0.5 ? ns data in hold time t khdx 1.0 ? 1.0 ? 1.0 ? ns clock low to data out hold time t klqx 0.5 ? 0.5 ? 0.5 ? ns 1 clock low to output active t klqx4 0.5 ? 0.5 ? 0.5 ? ns 1, 2 clock high to output high-z t khqz ? 2.5 ? 2.5 ? 2.5 ns 1, 2 output enable to high-z t ghqz ? 2.5 ? 2.5 ? 2.5 ns 1, 2 output enable to low-z t glqx 0.5 ? 0.5 ? 0.5 ? ns 1 output enable to output valid t glqv ? 1.8 ? 1.8 ? 1.8 ns 1 output enable setup time t ghkh 0.5 ? 0.5 ? 0.5 ? ns 1 output enable hold time t khgx 1.5 ? 1.5 ? 1.5 ? ns 1 sleep mode recovery time t zzr 200 ? 200 ? 200 ? ns sleep mode enable time t zze ? 9.0 ? 10.0 ? 11.0 ns 1. see the ac test loading figure on page 9. 2. verified by design and tested without guardbands.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 11 of 24 read and deselect cycles timing diagram k ss sw g dq sa t khkh q1 q2 q3 q4 t khkl t khqv t avkh t khax t svkh t khsx t khwx t wvkh t khqx4 t khqv t ghqz t glqx a2 a1 t klkh t glqv t khqx t khqz a3 a3 a4
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 12 of 24 crll3325.03 08/06/2001 read and write cycles timing diagram k ss sw g dq sa t khkh d2 q3 d4 t klkh t khkl t khqv t avkh t khax t svkh t khsx t khwx t wvkh t khqz t ghqz sbw t dvkh t khdx t klqv q2 a1 a2 a2 a4 q1 notes: 1. d2 is the input data written in memory location a2. 2. q2 is output data read from the write buffer, as a result of address a2 being a match from the last write cycle address. t khwx t wvkh t wvkh t khwx t khwx t wvkh t dvkh t khdx t klqx4 t khqv a3
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 13 of 24 synchronous sleep mode timing diagram k zz t khkh t zzr t zze addr dq t zvkh t zvkh t khqv q1 note: for t zzr < 200ns, access time will be equal to 2 x t khqv . a1 t avkh t khzx t khzx t khax
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 14 of 24 crll3325.03 08/06/2001 ieee 1149.1 tap and boundary scan the sram provides a limited set of jtag functions as defined in the ieee standard 1149.1 that are intended to test the interconnection between sram i/os and the printed circuit board traces or other components. there is no multiplexer in the path from the i/o pins to the sram core. in conformance with ieee standard 1149.1, the sram contains a test access port (tap) controller, instruc- tion register, boundary scan register, bypass register, and an id register. the tap controller has a standard 16-state machine that resets internally upon power-up; therefore, a test reset (trst) signal is not required. signal list tck: test clock tms: test mode select tdi: test data in tdo: test data out jtag dc operating characteristics (t a = 0 to +85 c) operates with jedec standard jesd8a (3.3v) logic signal levels parameter symbol min. typ. max. units notes jtag input high voltage v ih1 2.2 ? v dd +0.3 v1 jtag input low voltage v il1 -0.3 ? 0.8 v 1 jtag output high level v oh1 2.4 ?? v1, 2 jtag output low level v ol1 ?? 0.4 v 1, 3 1. all jtag inputs/outputs are lvttl compatible only. 2. i oh1 -|8ma|. 3. i ol1 +|8ma|. jtag ac test conditions (t a = 0 to +85 c, v dd = 3.3v -5%, +10%) parameter symbol conditions units input pulse high level v ih1 3.0 v input pulse low level v il1 0.0 v input rise time t r1 2.0 ns input fall time t f1 2.0 ns input and output timing reference level 1.5 v
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 15 of 24 jtag ac characteristics (t a = 0 to +85 c, v dd = 3.3v -5%, +10%) parameter symbol min. max. units tck cycle time t thth 20 ? ns tck high pulse width t thtl 7 ? ns tck low pulse width t tlth 7 ? ns tms setup t mvth 4 ? ns tms hold t thmx 4 ? ns tdi setup t dvth 4 ? ns tdi hold t thdx 4 ? ns tck low to valid data t tlov ? 7ns jtag timing diagram tck tms tdi tdo t thtl t tlth t thth t thmx t thdx t tlov t mvth t dvth
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 16 of 24 crll3325.03 08/06/2001 list of ieee 1149.1 standard violations 7.2.1.b, e 7.7.1.a-f 10.1.1.b, e scan register definition register name bit size x18 bit size x36 instruction 33 bypass 11 id 32 32 boundary scan * 51 70 * the boundary scan chain consists of the following bits: 36 or 18 bits for data inputs, depending on x18 or x36 configuration 18 bits for sa0 - sa17 in x36, 19 bits for sa0 - sa18 in x18 4 bits for sbwa - sbwd in x36, 2 bits for sbwa and sbwb in x18 9 bits for k, k , ss , g , sw , zz, m1 and m2 4bits for place holders for 8 mb, 5bits for place holders for 4mb * k and k clocks connect to a differential receiver that generates a single-ended clock signal. this signal and its inverted value are u sed for boundary scan sampling. id register definition part field bit number and description revision number (31:28) device density and configuration (27:18) vendor definition (17:12) manufacturer jedec code (11:1) start bit(0) 128k x 36 0101 011 010 1100 xxxxxx 000 101 001 00 1 256k x 18 0101 011 100 1011 xxxxxx 000 101 001 00 1 512k x 18 0101 101 111 0011 xxxxxx 000 101 001 00 1 256k x 36 0101 101 101 0100 xxxxxx 000 101 001 00 1 instruction set code instruction notes 000 sample-z 1 001 idcode 010 sample-z 1 011 private 5 100 sample 4 101 private 5 110 private 5 111 bypass 2, 3 1. places dqs in high-z in order to sample all input data regardless of other sram inputs. 2. tdi is sampled as an input to the first id register to allow for the serial shift of the external tdi data. 3. bypass register is initiated to v ss when bypass instruction is invoked. the bypass register also holds the last serially loaded tdi when exiting the shift dr state. 4. sample instruction does not place dqs in high-z. 5. this instruction is reserved for the exclusive use of ibm. invoking this instruction will cause improper sram functionality.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 17 of 24 10.7.1.a-d 6.1.1.d
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 18 of 24 crll3325.03 08/06/2001 boundary scan order (128k x 36), (256k x 36) (ph = place holder) exit order signal bump # exit order signal bump # exit order signal bump # 1 m2 5r 25 dq12 6f 49 dq26 2h 2 sa 4p 26 dq13 7e 50 dq25 1h 3 sa 4t 27 dq11 6e 51 sbw c3g 4sa6r28dq107d52 ph 2 4d 5 sa 5t 29 dq9 6d 53 ss 4e 6zz7t30sa6a54 ph 1 4g 7 dq0 6p 31 sa 6c 55 ph 2 4h 8 dq1 7p 32 sa 5c 56 sw 4m 9 dq2 6n 33 sa 5a 57 sbw d3l 10 dq4 7n 34 ph 1 (4mb), sa(8mb) 6b 58 dq34 1k 11 dq3 6m 35 sa 5b 59 dq35 2k 12 dq5 6l 36 sa 3b 60 dq33 1l 13 dq6 7l 37 ph 1 2b 61 dq32 2l 14 dq8 6k 38 sa 3a 62 dq30 2m 15 dq7 7k 39 sa 3c 63 dq29 1n 16 sbw a5l 40 sa 2c 64dq312n 17 k 4l 41 sa 2a 65 dq28 1p 18 k 4k 42 dq18 2d 66 dq27 2p 19 g 4f 43 dq19 1d 67 sa 3t 20 sbw b5g 44 dq20 2e 68 sa 2r 21 dq16 7h 45 dq22 1e 69 sa 4n 22 dq17 6h 46 dq21 2f 70 m1 3r 23 dq15 7g 47 dq23 2g 24 dq14 6g 48 dq24 1g 1. input of ph register connected to v ss . 2. input of ph register connected to v dd .
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 19 of 24 boundary scan order (256k x 18), (512k x 18) (ph = place holder) exit order signal bump # exit order signal bump # 1m25r27 ph 1 2b 2sa6t28sa3a 3sa4p29sa3c 4 sa6r 30 sa2c 5sa5t31sa2a 6zz7t32dq141d 7 dq5 7p 33 dq15 2e 8 dq6 6n 34 dq16 2g 9 dq7 6l 35 dq17 1h 10 dq8 7k 36 sbwb 3g 11 sbwa 5l 37 ph 2 4d 12 k 4l 38 ss 4e 13 k 4k 39 ph 1 4g 14 g 4f 40 ph 2 4h 15 dq4 6h 41 sw 4m 16 dq3 7g 42 dq13 2k 17 dq2 6f 43dq121l 18 dq1 7e 44 dq10 2m 19 dq0 6d 45 dq11 1n 20 sa 6a 46 dq9 2p 21 sa 6c 47 sa 3t 22 sa 5c 48 sa 2r 23 sa 5a 49 sa 4n 24 ph 1 (4mb), sa(8mb) 6b 50 sa 2t 25 sa 5b 51 m1 3r 26 sa 3b 1. input of ph register connected to v ss . 2. input of ph register connected to v dd .
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 20 of 24 crll3325.03 08/06/2001 tap controller state machine test logic reset run test idle select dr capture dr shift dr exit1 dr pause dr exit2 dr update dr select ir capture ir shift ir exit1 ir pause ir exit2 ir update ir 1 1 1 0 0 0 0 1 0 1 1 0 1 1 1 0 0 1 1 1 0 1 0 0 0 1 1 0 0 0 0 1
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 21 of 24 7 x17 bga dimensions ello? guv?na! note: all dimensions are in millimeters indicates a1 location underfill plate die plate 0.71 0.05 typ 0.701 0.099 underfill 0.1778 ref structural adhesive 1 2 3 4 5 6 7 u t r p n m l k j h fg e d c b a 7.62 1.27 0.889 0.04 diam. 3.19 ref 0.84 ref 20.32 16.764 12.7 ref 0.625 .254 14.00 12.294 top view side view bottom view 22.00 2.549 0.13 solder ball
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 22 of 24 crll3325.03 08/06/2001 references the following documents give recommendations, restrictions, and limitations for 2nd level attach process: double sided 4mb sram coupled cap pbga card assembly guide qualification information, including the scope of application conditions qualified, is available from your ibm sales representative. note: this document contains information on products in the sampling and/or initial production phases of development. this information is subject to change without notice. verify with your ibm field applications engineer that you have the latest version of this document before finalizing a design.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab preliminary 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram crll3325.03 08/06/2001 ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 23 of 24 revision log revision contents of modification 3/99 initial release. 7/99 updated 7 x17 bga dimensions on page 21. bit 52 updated. see boundary scan order (128k x 36), (256k x 36) on page 18. bit 37 updated. see boundary scan order (256k x 18), (512k x 18) on page 19. 12/19/00 rev. 02. made various minor editorial changes and format refinements. 02/28/01 rev. 03. updated dc electrical characteristics on page 7. changed maximum value for standby current (i sbss ) from 120ma to 150ma. changed maximum value for sleep current (i sbzz ) from 65ma to 100ma. 08/06/2001 rev. 03 release.
ibm0418a4anlab ibm0418a8anlab ibm0436a8anlab ibm0436a4anlab 8mb (256kx36 & 512kx18) and 4mb (128kx36 & 256kx18) sram preliminary ?ibm corporation. all rights reserved. use is further subject to the provisions at the end of this document. page 24 of 24 crll3325.03 08/06/2001 copyright and disclaimer ? copyright international business machines corporation 1999 all rights reserved printed in the united states of america august 2001 the following are trademarks of international business machines corporation in the united states, or other countries, or both. ibm ibm logo ieee is a registered trademark of the institute of electrical and electronics engineers. other company, product and service names may be trademarks or service marks of others. all information contained in this document is subject to change without notice. the products described in this document are not intended for use in implantation or other life support applications where malfunction may result in injury or death to persons. the information contained in this document does not affect or change ibm product specifications or warran- ties. nothing in this document shall operate as an express or implied license or indemnity under the intellectual property rights of ibm or third parties. all information contained in this document was obtained in specific environments, and is presented as an illustration. the results obtained in other operating environments may vary. while the information contained herein is believed to be accurate, such information is preliminary, and should not be relied upon for accuracy or completeness, and no representations or warranties of accuracy or completeness are made. the information contained in this document is provided on an ? as is ? basis. in no event will ibm be liable for damages arising directly or indirectly from any use of the information contained in this document. ibm microelectronics division 1580 route 52, bldg. 504 hopewell junction, ny 12533-6351 the ibm home page can be found at http://www.ibm.com the ibm microelectronics division home page can be found at http://www.chips.ibm.com crll3325.03 08/06/2001

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